We are pleased to announce the following two subjects in conjunction with the model change of our products for nanotechnology equipment performance enhancement.

■ Low Height Active Vibration Isolation System for Scanning Electron Microscope (SEM/FIB) αL4X-911R2
The αL4X-911R2 is suitable for high precision instruments such as scanning electron microscopes (SEM/FIB) and provides excellent vibration isolation performance from the low frequency range of 0.5 Hz.
The αL4X-911R2 realizes stable operation of electron microscopes and precision measuring instruments.
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■ Active Magnetic Field Canceller AMC-332
Realizes a magnetic field interference reduction up to 60 dB by cancelling magnetic fields fluctuation of the surroundings in real time.
The AMC-332 contributes to prevent performance degradation of electron microscopes and other electron beam applied equipment.
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We look forward to your continued patronage of our products.
Please feel free to contact us first.